Agilent 4073B Ultra Advance Parametric Tester
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System configuration if fully customizable. (Workstations, Instruments, and Test head configuration) Each tester has a full Performance Verification/Calibration completed before shipping. We also offer onsite installation and service!!
The 4073B Ultra Advanced Parametric Tester enables semiconductor manufacturers to dramatically reduce test time for capacitance measurements and DC measurements in high-volume semiconductor wafer manufacturing processes. It offers up to 40 percent higher throughput than the 4073A or 4072A. The 4073B is a flexible test solution. It performs precise DC measurements, capacitance measurements, flash memory cell testing, and testing of other high-frequency applications.
General features
The 4073B Ultra Advanced Parametric Tester enables semiconductor manufacturers to dramatically reduce test time for capacitance measurements and DC measurements in high-volume semiconductor wafer manufacturing processes. It offers up to 40 percent higher throughput than the 4073A or 4072A. The 4073B is a flexible test solution. It performs precise DC measurements, capacitance measurements, flash memory cell testing, and testing of other high-frequency applications.
General features
- Supports up to 2xHPSMU, up to 2xHRSMU, and up to 8 total SMUs
- Low-leakage switching matrix, customizable from 12 to 48 fully-guarded Kelvin outputs
- High-frequency switching matrix with integrated pulse generator control
- 8 auxiliary inputs and 48 extended path inputs for support of external instruments
- 2 microvolt and 1 femtoamp measurement resolution (HRSMU)
- +/- 200 Volts and +/- 1 Amp output capability (HPSMU)
- 1 kHz to 2 MHz capacitance frequency measurement range (HSCMU)
- +/- 1.6 Amp ground unit (GNDU)
- +/-40 V output (80 V peak-to-peak) at high impedance
- Pulse rise and fall times as fast as 20 ns
- Three-level output pulse capability
- Arbitrary Linear Waveform Generation (ALWG) function